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Test Probe A of IEC 61032 – 50mm Sphere with Baffle and Handle

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Test Probe A of IEC 61032 – 50mm Sphere with Baffle and Handle

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Descripción del Producto

50mm Sphere Test Probe A with Baffle and Handle.

Especificación:

IP1X Probe A /Test Probe A
1. According to: IEC61032:1997 / IEC60529:2001.
2. Test Probe A is necessary appliance for household and similar electrical appliance of against electric shock protection test.

Technical Parameter:

1. Ball Diameter:50 mm
2. Baffle Plate Diameter:45 mm
3. Baffle Plate Thickness: 4 mm
4. Handle Diameter:10 mm
5. Handle Length: 100 mm
6. According to IEC61032 figure 1 (the Test probe A), table 6 IEC60529 the first characteristics

Estándar:
IEC 61032 “Protection of persons and equipment by enclosures – Probes for verification”
IEC 60529 “Degrees of protection provided by enclosures (IP Code)”

SMT 1201 YK

Test Probe A of IEC 61032 – 50mm Sphere with Baffle and Handle

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